RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION

G. Srinivasa  Rao; R.R.L.  Kantam; K. Rosaiah; S.V.S.V.S.V.  Prasad

G. Srinivasa Rao Department of Statistics, Dilla University, Dilla, PO Box: 419, Ethiopia
R.R.L. Kantam Department of Statistics, Nagarjuna University, Guntur-522510, INDIA
K. Rosaiah Department of Statistics, Nagarjuna University, Guntur-522510, INDIA
S.V.S.V.S.V. Prasad Department of Statistics, Nagarjuna University, Guntur-522510, INDIA

Keywords: Type-II Exponentiated Log- logistic Distribution, Reliability Test Plans

Abstract

In this paper we consider a generalization of the log- logistic distribution called Type-II exponentiated log- logistic distribution suggested by Kotz and Nadarajah (2000). The operating characteristic for a sampling plan is determined for the case that a lot of products are submitted for inspection with lifetimes specified by a Type-II exponentiated log- logistic distribution (TELLD). The results are illustrated by a numerical example.

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