RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION
Abstract
In this paper we consider a generalization of the log- logistic distribution called Type-II exponentiated log- logistic distribution suggested by Kotz and Nadarajah (2000). The operating characteristic for a sampling plan is determined for the case that a lot of products are submitted for inspection with lifetimes specified by a Type-II exponentiated log- logistic distribution (TELLD). The results are illustrated by a numerical example.