Okano, Seidai, Yoshinobu Tamura, and Shigeru Yamada. “Sensitivity Analysis Considering Wiener Processes and Deep Learning for OSS Reliability Assessment”. Journal of Graphic Era University 14, no. 01 (October 24, 2025): 35–52. Accessed October 25, 2025. https://riverpublishersjournal.com/index.php/JGEU/article/view/444.